|
USED SEM SCANNING ELECTRON
MICROSCOPES (SEMs)
Buy & sell, JEOL, Hitachi SEMs,
FEI, used Philips tools for sale and wanted, TEM,
FE-SEM, FIB, ion beam microscopy systems, field emission
and transmission
electron microscopes for sale.
Most tools are
for sale directly from the actual owner, many with demo
available,
been under continuous OEM maintenance contract and offer the
ability for you
to SAVE tens
of thousands
of dollars than that from
dealers / refurbishers.
Updated October 12, 2009
PLEASE CONTACT TO
SELL YOUR SURPLUS ASSETS
Zeiss
1540XB, focused ion beam, with EDS ...latest technology
Field emission type scanning electron microscope with
x-ray and EBSD detectors
for material analysis. Focused ion beam cut and polish
samples on the nanometer
scale as well as high precision deposition of tungsten,
titanium, and silicon dioxide.
Jeol
model JSM-6600FX Scanning Electron Microscope with X Vision
Pre-owned Scanning
Electron Microscopes
- FEI XL30 (W) ODP SEM
- FEI / Philips XL40 DX4 SEM
- Hitachi S-4100 SEM Surface Inspection
- Hitachi S-4160 SEM
- Hitachi S-4500 SEM
- Hitachi S-4500 Type 2 SEM
- Hitachi S-4700 SEM
- Hitachi S-4700 Type 2 SEM
- JEOL JSM-840 SEM
Hitachi S-5000 FEG SEM
- Hitachi S-5200 SEM
- Hitachi S-6000 SEM, 4" to 5"
- Hitachi S-6100 SEM
- Hitachi S-8620 SEM, 8"
` Hitachi S-8820 SEM, 8"
- Hitachi S-8840 SEM, 8"
- Hitachi S-9200 SEM, 8"
- Hitachi S-9220 SEM, 8"
- Hitachi S-9260 SEM
- Hitachi S-9300 SEM, 8"
- JEOL 6KV SEM
- JEOL JSM-6600 SEM
- JEOL JSM-6600F SEM
- JEOL JSM-6360LV SEM
- JEOL JSM-840 SEM
- JEOL 6400 SEM
- JEOL JWS-7700 SEM, 8"
- JEOL JWS-7700 SEM w/ EDS and 5 kV option
- JEOL JWS-7700 SEM w/ EDX. EDS and 12 kV option
- JEOL JSM-840 SEM with EDAX
JEOL 6390 Scanning Electron Microscope, Resolution: 3.0nm
(at 30kV and
8mm WD), Magnification: 5X to 300,000X (163 steps), computer,
MP-01010(XY)
Motorized X and Y axes LGS stage, MP-34470(BEIW) Backscattering Electron
Detector, R033SP/W Water recirculator, GW-IRCS-PIP GW IF chamberscope
can be use for imaging samples with Wet SEM technology...FOR SALE
JEOL 5400 scanning electron microscope & ISI model DS-130
Hitachi SEM model S-570
w/ Lab6 gun
Amray, 1910 with Kevex sigma system. Lab 6 element, in working order
when placed in the warehouse.
Amray 1830I SEM with EDAX attachment for sale, in working
condition. Software
for EDAX system is Phoenix which is also able to obtain digital SEM
images, also
the EDAX has a super ultra thin window (SUTW).
JEOL JSM 6320F Field Emission, Vibration Isolation Table, Upper/Lower SE
Detectors + Retractable BSE Detector, Digital Scan Generator, Water
Chiller,
EDS System – Oxford 6886 30 mm2 SiLi with Controller and PC.
SOLD
Sell your SEM here, this page is one of highest rated Google "Used Sem"
sites in the world and offers tremendous exposure for your
surplus system.
Amray 1820 SEM with Energy Dispersive X-Ray Spectrometer
Hitachi S4500 SEM, demo and pictures available.
HITACHI S-3500N SEM, was
working when de-installed, includes PC
Joel JSM-6340F Field
Emission Scanning Electron Microscope with Oxford
model 7158 INCA Microanalysis system, Jeol Stage Controller &
PC, monitor,
HP Vectra Pentium 3 CPU, Windows NT 98, HP laser printer,
Exela Cool Ace
model CA-2500 Cooling Unit, large chamber.
For systems that have been de-installed, crated, or warehoused,
we can offer
at additional cost, either a base-line functional installation, or a fair
priced full
refurbishment, upgrades and install, with warranty on most models.
JEOL 6335F FESEM, vintage 2002,
JSM-6335F is a high resolution
conventional Field Emission Scanning Electron Microscope.
Tool
is pristine due to very little use, contact for full details.
JEOL JSM-5400 with Noran Voyager EDS (1997) and
available for operational
demonstration, $45,000
++++++++++++++++++++++++++++++++++++++++++++++++++++++++
All
products listed are subject to prior sale.
Please
send an email to offer your surplus assets.
Please contact for further information regarding this
laboratory instrumentation.
CONTACT
via phone:
508-598-7334 or email:
Sales@national-ate.com
NATIONAL A.T.E.
Buys, Sells, & Brokers, used and pre-owned scanning electron
microscopes, semiconductor testers, IC
test systems,
semiconductor production
equipment, laser markers, microscopes, wafer
probe inspection, pre-owned SMT,
surplus thermal forcing systems,
and In-Circuit test
systems ICT.
Also consignment of customer owned used and
surplus equipment.
IC
Handlers /
Newest Listings
/
Wafer Probers
/
Environmental
/
Wanted Equipment
/
List
Your Wanted
Home
/
SUBSCRIBE HERE
/
SALES OPPORTUNITY
/
BONDERS
/
Semi Links
/
Used
Lab /
Buy a
Microscope /
Used Lasers
terms of use
All
product names and trademarks listed herein are the property of
their respective holders.
No part of this web page may be copied, duplicated, or
transmitted by any means
mechanical or electronic, without the written permission of
NATIONAL A.T.E.
Copyright © 1997-2009 All Rights Reserved.
|
